Department of Chemistry

David Klenerman FRS Publications (2002)


Scanning surface confocal microscopy for simultaneous topographical and fluorescence imaging: Application to single virus-like particle entry into a cell
Gorelik J, Shevchuk A, Ramalho M, Elliott M, Lei C, Higgins CF, Lab MJ, Klenerman D, Krauzewicz N, Korchev Y
P NATL ACAD SCI USA, 2002, 25, 16018-16023. DOI: 10.1073/pnas.252458399


Ion channels in small cells and subcellular structures can be studied with a smart patch-clamp system
Gorelik J, Gu YC, Spohr HA, Shevchuk AI, Lab MJ, Harding SE, Edwards CRW, Whitaker M, Moss GWJ, Benton DCH, Sanchez D, Darszon A, Vodyanoy I, Klenerman D, Korchev YE
BIOPHYS J, 2002-12, 6, 3296-3303.


Writing with DNA and protein using a nanopipet for controlled delivery.
Bruckbauer A, Ying L, Rothery AM, Zhou D, Shevchuk AI, Abell C, Korchev YE, Klenerman D
J Am Chem Soc, 2002, 30, 8810-8811.


Writing with DNA and protein using a nanopipet for controlled delivery
Bruckbauer A, Ying LM, Rothery AM, Zhou DJ, Shevchuk AI, Abell C, Korchev YE, Klenerman D
J AM CHEM SOC, 2002, 30, 8810-8811. DOI: 10.1021/ja026816c


Characterization of a novel light source for simultaneous optical and scanning ion conductance microscopy
Bruckbauer A, Ying LM, Rothery AM, Korchev YE, Klenerman D
ANAL CHEM, 2002, 11, 2612-2616. DOI: 10.1021/ac011257y


Single-molecule FRET study of DNA G-quadruplex
Green J, Ying LM, Klenerman D, Blasubramanian S
CHEM RES CHINESE U, 2002-05, 2, 103-106.


High-resolution scanning patch-clamp: new insights into cell function
Gu YC, Gorelik J, Spohr HA, Shevchuk A, Lab MJ, Harding SE, Vodyanoy I, Klenerman D, Korchev YE
FASEB J, 2002-03, 3, 748-+. DOI: 10.1096/fj.01-1024fje


Programmable delivery of DNA through a nanopipet
Ying LM, Bruckbauer A, Rothery AM, Korchev YE, Klenerman D
ANAL CHEM, 2002, 6, 1380-1385. DOI: 10.1021/ac015674m


Effect of cavitation on carbon dioxide corrosion and the development of a test for evaluating inhibitors
Petersen AG, Klenerman D, Hedges WM, Harris ML
CORROSION, 2002-03, 3, 216-224.


A Sensitive and Economical Method to Directly Detect Particles
Cooper MA, Ostanin VP, Klenerman D, Slepstov A, Karamanska R, Dultsev FN, Stirrups K, Kelling S, Minson T, Abell C
Proceedings of IEEE Sensors, 2002, 2, 1042-1045.